Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction ...

Abstract: The application of newly developed imaging techniques using X-ray Free Electron Laser (XFEL) sources requires equally new methods for analysing the large volumes of data collected. Methods ...

In the field of scanning electron microscopy (SEM), the electron backscatter diffraction (EBSD) method has developed into a robust tool for the crystallographic analysis of materials. Specifically, ...

Abstract: Phase retrieval is an inverse problem that consists in estimating a scene from diffraction intensities. This problem appears in optical imaging, which has three main diffraction zones where ...

In Crystallography, Transmission Electron Microscopy(TEM) is a microscopy technique that allows us to analyze crystal structure by diffraction pattern. The two largest categories of diffraction ...

For more than 100 years, scientists have been using X-ray crystallography to determine the structure of crystalline materials such as metals, rocks, and ceramics. Whether sedimentary rocks store ...

Researchers at Lawrence Berkeley National Laboratory have developed a 4D-STEM workflow that can isolate and solve atomic structures from individual nanocrystals buried inside dense, tangled clusters, ...

Diffraction patterns of a rotated grating are investigated from both theoretical and experimental points of view. It is shown that as the grating rotates, the angle of deviation of each diffracted ...