Artificial intelligence (AI) has made remarkable strides in recent years, particularly in its ability to reason. At the heart of this evolution are new technologies like neural networks and large ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

This paper reviews the fundamentals and research progress of carbon-based multivariable chemical sensors, with a particular focus on the classification and identification of multiple analytes.

Pattern-recognition algorithms developed for biometric identification are now analysing internal engine components, allowing ...