PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
New NASA-level software framework reproduces DUT vs ΛCDM results, resolving Hubble and growth tensions with Δχ² = ...
Background Preprocedural risk prediction of 30-day all-cause mortality after percutaneous coronary intervention (PCI) aids in clinical decision-making and benchmarking hospital performance. This study ...
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