PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

1 Department of Computer and Instructional Technologies Education, Gazi Faculty of Education, Gazi University, Ankara, Türkiye. 2 Department of Forensic Informatics, Institute of Informatics, Gazi ...

New NASA-level software framework reproduces DUT vs ΛCDM results, resolving Hubble and growth tensions with Δχ² = ...

In this report, we talk to experts such as Sumcab Robotics, Fanuc, Ingemat, Robotnik and ABB about the current situation in the sector, the challenges it faces and the emergence of AI, as we ...